DENES MARTON

PO Box 781768 San Antonio, TX 78278
Phone: (210) 493-4629 (Home) Fax: (210) 493-4634 (Fax)
e-mail: dmarton@hal-pc.org

Accomplished Materials Scientist

Extensive experience in materials science, surface analysis, and applied research in semiconductors, thin films, and shape memory alloys.
Particularly effective team player in problem solving, trouble-shooting, and R&D for high-tech industries.
A results-oriented professional who combines experience with imagination.

PROFESSIONAL EXPERIENCE

INDUSTRIAL R&D

Developed process for deposition of freestanding nitinol films for medical device use (patent pending)
Applied ToF SIMS (Time of Flight Secondary Ion Mass Spectrometry) and small spot XPS (X-ray Photoelectron Spectroscopy) in medical device development
Helped to design new intravascular medical devices (patented) and developed methods of characterization
Designed and developed a commercial Secondary Ion Mass Spectrometer (SIMS), negotiated contracts for the sale of the first five instruments
Invented a new technique for the surface roughness distribution imaging (patented)
Invented a new technique for wear measurement of thin films (patented)
Performed trouble-shooting and research for a variety of industrial clients including NASA, semiconductor, electronics, aluminum, steel, and petroleum industries

LEADERSHIP

Directed development of surface finishing of cardiovascular medical devices
Directed the Surface Science Laboratory (first in Hungary) serving academic and industrial clients. At the end of my tenure the Laboratory had one SAM (Scanning Auger) and three SIMS instruments, an X-ray diffractometer, UHV (ultrahigh vacuum) component and electronics shops, and a full line of crystal preparation facilities
Supervised chemists, scientists, financial managers, and skilled technicians
Trained graduate students
Negotiated industrial contracts, wrote proposals, secured government grants

BASIC RESEARCH

Initiated ion beam synthesis of "harder than diamond" carbon-nitride
Introduced novel method for measuring ion induced displacement energies and penetration thresholds
Discovered relationship between specimen microstructure, surface roughness and depth resolution of sputter depth profiling

SKILLS

Surface analysis using XPS, ToF SIMS, AES (Auger Electron Spectroscopy) and other techniques
Thorough understanding of vacuum technology, sputter and ion beam deposition
Up to date computer and internet skills
Languages: English, Hungarian, Russian, and German
Registered Patent Agent

PUBLICATIONS

Authored independent chapters of three scientific books
Published over 90 papers in refereed journals. A complete list of the scientific publications is available
Inventor of several US patents (three issued)

AWARDS

Texas Advanced Research Grant, 1992
R & D 100 Award for the Scanning Scattering Microscope, 1990
Fulbright scholarship, 1985

MEMBERSHIPS

EDUCATION

Ph. D., Hungarian Academy of Sciences, Budapest
Doctor of Physics, A. Jozsef University of Sciences, Szeged, Hungary
Double Diploma in Electrical Engineering & Physics, Ulianov Electrotechnical Institute, Leningrad, USSR

EMPLOYMENT HISTORY

Advanced BioProsthetic Surfaces Ltd and Dept. of Radiology, UT Health Science Center at San Antonio (San Antonio, TX) Materials Scientist
Department of Chemistry, University of Houston (Houston, TX). Research Associate Professor
National Institute of Standards and Technology (NIST, Gaithersburg, MD). Visiting Scientist
Technical University Budapest (Budapest, Hungary). Associate Professor, Head of Surface Science Laboratory
Tungsram Semiconductor Laboratories (Budapest, Hungary). Research Engineer

CITIZENSHIP

U.S. citizen